ARFTG 75th Conference Technical Program

Session: Poster	Interactive Forum
Chair:	Ron Ginley, NIST
Abstract:	A selection of poster presentations covering the measurement of modulated signals, nonlinear measurement techniques, calibration and verification methods, pulsed measurements, and device modeling.

Poster-1	Calibration standards for digital modulation error Based on CW,AM or PM signal
9:30 AM-10:30 AM	Z. R. Mr, Z. F. Mr, G. L. Qing, W. N. Prof, China Academy of telecommunication Research of MIIT, Beijing, China
(20)	modulation error parameters include Error Vector Magnitude (EVM), MagErr and PhaseErr. However, there are problems for metrology of digital modulation error: first, the signal source and vector signal analyzers calibrates each other, forms a closed-loop, the calibration is not traceable. Second, digital modulation error are set in the "0" point in calibration. To solve the problems, we propose a new method: use combination of two CW, analog AM or PM signal, to construct an “equivalent MPSK signals” with certain modulation error. The equivalent MPSK signals’ EvmRms, EvmPeak, MagErrRms, MagErrPeak, PhaseErrRms and PhaseErrPeak is are solely decided by power ratio of two CW, or by AM depth or PM phase deviation, and can be calculated accurately, and are continuously adjustable within a wide range. Experiment shows that the method is effective. This has established a standard of digital modulation error.

Poster-2	Harmonic Load Pull of High-Power Microwave Devices using Fundamental-Only Load Pull Tuners
9:30 AM-10:30 AM	J. Hoversten, M. Roberg, Z. Popovic, University of Colorado at Boulder, Boulder, United States
(38)	This paper presents a high-power high-efficiency PA design method using traditional fundamental-frequency load pull tuners. Harmonic impedance control at the virtual drain is accomplished through the use of tunable pre-matching circuits and full-wave FEM modeling of package parasitics. A 10-mm gate periphery GaN transistor from TriQuint is characterized using the method, and load-pull contours are presented illustrating the dramatic impact of varying 2nd harmonic termination. A 3rd harmonic termination is added to satisfy conditions for class-F-inverse load pull, resulting in an 8% efficiency improvement over the best-case 2nd harmonic termination. The method is verified by design and measurement of a 36-W class-F-inverse PA prototype at 2.14GHz with 81% drain efficiency and 14.5dB gain (78% PAE) in pulsed operation.

Poster-3	S-functions behavioral model order reduction based on narrow-band modulated large-signal network analyzer measurements
9:30 AM-10:30 AM	M. Myslinski¹, F. Verbeyst², M. Vanden Bossche², D. Schreurs¹, ¹K.U.Leuven, Leuven, Belgium, ²NMDG n.v., Bornem, Belgium
(39)	In this paper we report for the first time on order reduction applied to S-functions behavioral models. The most dominant model parameters are selected based on the relative uncertainty of their estimated values evaluated against a threshold value. The selection procedure is performed on the same measurement data that is used to extract the model and obtained using a large-signal network analyzer. High level of model order reduction, achieved without any substantial loss of the prediction accuracy, is demonstrated on S-functions extracted for a packaged pHEMT device.

Poster-4	X-Parameter Measurement Challenges for Unmatched Device Characterization
9:30 AM-10:30 AM	D. T. Bespalko, S. Boumaiza, University of Waterloo, Waterloo, Canada
(46)	X-parameter technology provides simulation-based design of non-linear circuits with inherent accuracy that is attributed to measurement-based model extraction. Recent advancements have combined Non-linear Vector Network Analyzer measurements with impedance tuners to compliment the equivalent accuracy of load-pull measurements with the analytic convenience of equation-based large-signal models. This paper investigates the challenges incurred when modeling high-power transistors under variable complex impedance matching conditions. It also compares the predicted performance of the X-parameter model against an independent large-signal model provided by the manufacturer for a 10W transistor. The results show a good correlation between the two models when compared under load-pull impedance modulation.

Poster-5	Time reference for measurements of arbitrarily shaped pulses.
9:30 AM-10:30 AM	M. Odyniec, NSTec, Livermore, , United States
(16)	This paper addresses measurements of relative timing of irregularly and differently shaped pulses (by which we mean signals that are zero beyond a finite interval). For such pulses the usual time reference points become useless: rising edges may change their slopes and shapes, and maxima might split. We propose a definition of the time reference applicable to smooth but otherwise arbitrary pulses. It is applicable to signal scaling, simplifies the covariance matrix (of parameters’ error estimates) and yields an effective analytic estimate of timing error.

Poster-6	Analysis of Phase Noise Effect On Microwave Attenuation Precision Measurement Using A Heterodyne Receiver
9:30 AM-10:30 AM	T. Y. Wu¹, S. W. Chua¹, Y. L. Lu², ¹A*STAR, Singapore, Singapore, ²Nanyang Technological University, Singapore, Singapore
(13)	The phase noise effect on microwave attenuation precision measurement using a lock-in amplifier (LIA) is studied. A frequency domain phase noise modeling is used to analyse the phase sensitive detection made by the LIA. The error bound for the magnitude and phase of LIA measurement has been established. The theoretical prediction of the maximum magnitude and phase fluctuation in LIA output agrees with the measured data quite well. This analysis is important for estimating the maximum attenuation measurement error caused by the phase noise of microwave sources and its uncertainty contribution to microwave attenuation measurement.

Poster-7	Automation of Absolute Phase/Power Calibrations Applied to Real Time Large Signal Systems
9:30 AM-10:30 AM	I. Volokhine, NXP Semiconductors, Nijmegen, Netherlands
(25)	A nonlinear test set is presented to automate absolute calibrations in an on-wafer real time load pull measurement system featuring time domain capability. The absolute power and phase calibrations are essential steps in any nonlinear system and they require, in general, cumbersome manual procedures. The solution is presented to overcome such laborious and error-prone manual procedures with automated absolute calibrations. It makes preparation for on-wafer nonlinear measurement easy and fast by combining commutation of the signal paths and coaxial standards. It includes a power sensor and phase reference device, which are required for on-wafer absolute calibrations. The automation also improves the accuracy and reproducibility of all nonlinear measurements.

Poster-8	Uncertainties in Coplanar Waveguide and Microstrip Line Standards for On-Wafer Thru-Reflect-Line Calibrations
9:30 AM-10:30 AM	U. Arz, K. Kuhlmann, PTB, Braunschweig, Germany
(29)	In this paper the effect of uncertainties in the crosssectional parameters of CPWs and MSLs (e.g. line geometry, substrate material) on the propagation constants is investigated, and fundamental differences between CPW and MSL are illustrated. Since both planar waveguides can be characterized by on-wafer S-parameter measurements, the propagation of uncertainties when using either CPWs or MSLs as calibration standards for the well-known Thru-Reflect-Line calibration procedure is also investigated.

Poster-9	Multimode TRL Technique for De-embedding of Differential Devices
9:30 AM-10:30 AM	M. Wojnowski¹, V. Issakov¹, G. Sommer¹, R. Weigel², ¹Infineon Technologies AG, Neubiberg, Germany, ²University of Erlangen-Nuremberg, Erlangen, Germany
(33)	The multimode TRL calibration method generalizes the standard TRL technique to multimode waveguides. In this paper, the practical use of the multimode TRL calibration technique for de-embedding purposes is discussed. The focus is on the four-port case, since this covers the majority of the practical applications. The common de-embedding assumptions such as reciprocity and symmetry are analyzed and their consequences on the multimode TRL algorithm are discussed. It is shown that the reciprocity assumption applied to the embedding networks reduces the requirements on the reflect standard. It is demonstrated that additional assumptions of either identical or symmetrical error networks make it possible to completely resolve the problem related to the reflect standard. Finally, the measurement results are presented that verify the multimode TRL approach for de-embedding of four-port differential devices.

Poster-10	Comparison of noise figure calibration and measurement techniques using noise figure verification techniques
9:30 AM-10:30 AM	B. Shoulders, K. H. Wong, Agilent Technologies, Santa Rosa, United States
(34)	Abstract. We perform noise figure calibrations on a noise measurement receiver using the following techniques: A “Y-factor” technique that uses two source impedance states (a characterized “excess” noise source and a low reflection room temperature termination) in both the calibration and the measurement, a “Vector Cold Noise (VCN)” technique that uses multiple room temperature source impedance states in both the calibration and the measurement along with a characterized “excess” noise source in the , calibration, a “Scalar Cold Noise” technique that uses the same calibration as the VCN technique, but uses only a low reflection room temperature source impedance state in the measurement, and a modified VCN technique, which uses a direct characterization of the gain bandwidth product of the receiver (using a characterized power sensor) in place of the characterized excess noise source. Following each calibration, we verify the calibration after the method of Randa.

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