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Session: Session 43:15 PM Friday, June 20, 2008 Room: Omni Hotel |
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Session: Session 4 | Active Devices |
Chair: | Ed Godshalk, Maxim Integrated Products |
| | Session 4-1 | Phase Shift Deskew of Oscilloscope Current and Voltage Sensing Probes by Means of Energy Balance | - | P. Molina Gaudo, C. Bernal, University of Zaragoza, Zaragoza, Spain |
(26) | To model losses of active devices in switching operation, such as class E amplifiers, it is of interest to characterize equivalent switching losses in cut-off and conduction. Ideally, losses can be estimated by means of power balance. To be able to perform accurate power balance measurements, instant power has to be known and integrated. To obtain reliable results accurate phase shift between current and voltage sensing probes (skew) has to be known for the particular measurement frequency and test set. This is particularly important when losses are small compared to overall power delivery which is the case of high efficiency power amplifiers. This paper proposes a simple adjustment method, also based in power balance. | | |
Session 4-2 | Characterization of Active Harmonic Phase Standard with Improved Characteristics for Nonlinear Vector Network Analyzer Calibration | - | D. B. Gunyan1, Y. P. Teoh2, 1Agilent Technologies, Santa Rosa, United States, 2Agilent Technologies, Penang, Malaysia |
(30) | This paper presents unique characteristics of a new active harmonic phase standard (HPS) for use in phase calibration of nonlinear vector network analyzers (NVNAs). The phase and amplitude characteristics are measured at various input powers, fundamental frequencies, and temperatures. The new active HPS is found to have a low sensitivity to these variables. This means that unlike conventional SRD-based HPS approaches, the new active HPS can be calibrated at a single fundamental frequency, input power level, and temperature, and still be successfully applied to a wide range of input powers and fundamental frequencies. The new HPS is compared to a conventional SRD-based HPS and found to be superior for NVNA calibration and related applications. | | |
Session 4-3 | An Extension of Existing Real-Time Load Pull Systems to Perform Voltage/Current Waveform Reconstruction | - | I. Volokhine, NXP-TSMC Research Center, Eindhoven, Eindhoven, Netherlands |
(13) | A complete system to perform voltage/current waveform reconstruction during single-tone non-linear characterization of on-wafer devices including measurements of source reflection coefficients is presented. The solution is an extension of an existing real time active load pull system, which requires neither modification of the existing instruments nor a complicated calibration procedure or extra pre-characterization of components, thereby preserving all attractive features of the original system such as 100 dB dynamic range. The extension is relatively simple requiring only two comb generators and one additional calibration step to provide a spectacular enhancement of on-wafer characterization capability of non-linear devices. | | |
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