 |
Session: Session 210:20 AM Friday, June 20, 2008 Room: Omni Hotel |
 |
|
| |
Session: Session 2 | VNA Calibration |
Chair: | Dave Blackham, Agilent Technologies |
| | Session 2-1 | Monte-Carlo Analysis of Measurement Uncertainties for On-Wafer Thru-Reflect-Line Calibrations | - | J. Leinhos2, U. Arz1, 1PTB, Braunschweig, Germany, 2Leibniz University Hannover, Hannover, Germany |
(27) | Although on-wafer high-frequency measurements are nowadays commonly used, uncertainties for scatteringparameter measurements in planar transmission lines are still not yet established - a problem which has been long solved in coaxial lines and waveguides. We describe a GUM-compliant approach that is capable of providing a traceability path for on-wafer measurements up to 50 GHz using the TRL calibration algorithm. | | |
Session 2-2 | A Mixed-Mode TRL Algorithm Based on Symmetrical Reflection Standards | - | L. Wan1, Q. Li2, 1Beijing University of Aeronautics and Astronautics, Beijing, China, 2Agilent Technologies, Beijing, China |
(17) | A mixed-mode TRL calibration algorithm based on symmetrical reflection standards is proposed for differential devices measurements. According to the passive fixture’s generalized reciprocity and the phase relationship between its common-mode and differential-mode transmission parameters, the sign ambiguity is removed and the fixtures’ generalized transfer matrices are obtained for both homogeneous and inhomogeneous transmission lines. To verify the proposed algorithm, it is applied to de-embed the DUTs’ mixed-mode s-parameters from measurement data, and the experimental results are compared with that from full wave simulation. The agreement of the data obtained through both approaches indicates that the proposed technique is valid to calibrate linear differential devices. | | |
Session 2-3 | Accurate Broadband RLCG-Parameter Extraction with TRL Calibration | - | M. Wojnowski1, M. Engl1, V. Issakov1, G. Sommer1, R. Weigel2, 1Infineon Technologies AG, Neubiberg, Germany, 2University of Erlangen-Nuremberg, Erlangen, Germany |
(31) | In this paper we analyze the impact of systematic errors in TRL calibration on the extracted equivalent circuit parameters of the measured device. We mainly focus on extraction of RLCG-parameters (resistance, inductance, capacitance, conductance) of transmission lines and inductors. We show how the uncertainties in measured S-parameters and in determined characteristic impedance propagate into RLCG-parameters. In particular, we emphasize the importance and the difficulty of an accurate determination of the imaginary part of characteristic impedance. We use the results of our sensitivity analysis to estimate the accuracy of RLCG-parameter extraction of a coplanar transmission line and a 2.2 nH spiral inductor. Finally, we propose an alternative method for determination of certain RLCG-parameters based on causal relationships. | | |
Session 2-4 | Over-Determined Offset Short Calibration of a VNA | - | J. P. Hoffmann, P. Leuchtmann, R. Vahldieck, ETH Zurich, Zurich, Switzerland |
(10) | Electromagnetic modeling of coaxial 1.85mm and 1.0mm standards for Vector Network Analyzer (VNA) calibration shows only limited accuracy. The approach presented in this paper can overcome this accuracy limitation. Instead of handing over the standards' S-parameters to the calibration algorithm, parameterized models of the standards are used as input into the calibration algorithm. The technique is demonstrated with an offset short calibration where the unknown phase constant of the short's parameterized model is estimated with the calibration algorithm. No assumptions on the frequency dependency of the phase constant are needed. Further on we describe the best constellation of the offset shorts' reflection coefficients in the Smith chart when calibrating a one-port. | | |
If you encounter any problems, please contact |
|
|
| |
|
|
|