Prior ARFTG Conference - site not in use Technical Program

Session: P1	Poster Session 1 - Time Domain and Linear Network Measurement
Chair:	Evan Fledell, Intel Corporation

P1-1	Time-domain and mechanical assessments of 1.0 mm coaxial air lines
9:30 AM-10:40 AM	M. Horibe, M. Shida, K. Komiyama, AIST, Tsukuba, Japan
(19)	This paper presents an assessment of 1.0 mm coaxial air lines for use as reference impedance standards at microwave and millimetre-wave frequencies in frequency domain and time domain measurements. The time-domain measurements proved to be effective in assessment of air lines [1]. This time, the assessments are performed for air lines in 1.0 mm line size. The assessment is based primarily of mechanical measurement and using several different types of time-domain reflection measurement on commercial Vector Network Analysers (VNAs). The paper includes a comparison between the results obtained by these time-domain measurement options and mechanical measurement for reflections and electrical lengths. Frequency domain measurements, up to 110 GHz, are also included to complete the assessment of the lines.

P1-2	Hidden Problems in Precise Calibration on Microstrip
9:30 AM-10:40 AM	J. Raboch, K. Hoffmann, Z. Skvor, P. Hudec, Czech Technical University in Prague, Prague 6, Czech Republic
(29)	A study of calibration problems on microstrip with respect to interaction of electromagnetic fields around SMA to microstrip launcher and microstrip short was carried out in frequency band up to 26 GHz. Omni Spectra SMA to microstrip launcher, 50 Ohm microstrip line on Arlon CuClad 223 0.508 mm thick substrate and microstrip shorts with reflective wall above the upper side of substrate as a calibration elements were used for simulations in CST Microwave Studio. Strong influence of dimensions of shorts and distance between the shorts and the launcher on simulated calibration data was observed. Reasonable dimensions of the short and the distance between the short and the launcher making possible correct precise calibration were determined.

P1-3	A Simple Method for Extreme Impedances Measurement - Experimental Testing
9:30 AM-10:40 AM	M. Randus, K. Hoffmann, Czech Technical University in Prague, Prague, Czech Republic
(13)	This paper directly follows and extends [1] where a novel method for measurement of extreme impedances is described theoretically. In this paper experiments proving that the method [1] can significantly improve stability of a measurement system are described. Using Agilent PNA E8364A VNA the method is able to measure reflection coefficient with stability improved 36-times in magnitude and 354-times in phase compared to the classical method of measurement. Further, validity of the error model and related equations stated in [1] are verified by real measurement of SMD resistors (size 0603) in microwave test fixture. Values of the measured SMD resistors range from 12 kOhm up to 330 kOhm. A novel calibration technique using three different resistors as calibration standards is used. The measured values of impedances reasonably agree with assumed values. [1] M. Randus, and K. Hoffmann, “A simple method for extreme impedances measurement,” 2007 ARFTG Int. Conference. December 2007.

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