Session: F | Calibration |
Chair: | Nick Ridler, National Physical Lab |
Abstract: | Enhancing measurement accuracy and defining measurement reference planes through calibration and the tools for calibration implementation is the subject of this session. |
| | F-1 | Reciprocity-based multiport de-embedding and an analysis of standard sensitivity |
10:40 AM-11:00 AM | J. Martens, Anritsu Company, Morgan Hill, United States |
(17) | Multiport de-embedding techniques have been becoming of increasing interest as the paths between probe pads and the DUT become more three-dimensional and more coupled. Circuit-model-based de-embedding schemes often suffer from a lack of adaptability to slightly different layouts. Fully general de-embedding approaches may require too many standards or too much knowledge about those standards. A general approach enforcing reciprocity and a few other constraints on leakage behavior can potentially work around both limitations while providing a reasonable computational framework in the general n-port case. Such a method will be discussed and de-embedding examples presented as a vehicle for a heuristic analysis of the sensitivity of the de-embedding to the quality/knowledge of the standards. |
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F-2 | Traceability of VNA Measurements |
11:00 AM-11:20 AM | K. Wong, Agilent Technologies, Inc., Santa Rosa, United States |
(26) | Abstract – Measurement traceability is NOT just a requirement in ISO quality standards. It is a necessity to ensure the accuracy of any measurement system. For vector network analyzers (VNA), the traceability of S-parameter measurements is not obvious. The latest generation of VNA is also capable of making measurements beyond S-parameters. This paper will present the latest developments in VNA measurement traceability chain, the key traceable parameters, calibration and verification standard traceability and some verification techniques and results. |
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F-3 | The Influence of Calibration Substrate Boundary Conditions on CPW Characteristics and Calibration Accuracy at mm-Wave Frequencies |
11:20 AM-11:40 AM | A. Rumiantsev1, R. Doerner2, E. M. Godshalk3, 1SUSS MicroTec Test Systems GmbH, Sacka, Germany, 2Ferdinand-Braun-Institut fuer Hoechstfrequenztechnik (FBH), Berlin, Germany, 3Maxim Integrated Products, Inc., Sunnyvale, United States |
(37) | This paper presents new experimental investigations of the influence of calibration substrate boundary conditions on CPW transmission line characteristics and calibration accuracy at millimeter wavelengths. A new configuration that decreases insertion loss of CPW transmission lines and improves calibration accuracy is suggested. |
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F-4 | Software Solutions for Linear and Non-Linear Microwave Measurements and Calibrations |
11:40 AM-12:00 AM | A. Ferrero, V. Teppati, M. Garelli, S. Bonino, U. Pisani, Politecnico di Torino, Torino, Italy |
(47) | In modern microwaves systems, software plays a fundamental role for the organization and handling of different types of measurements and its impact is often underestimated. This paper presents some criteria and software technologies that proved to be very effective for the development of multiport/load-pull measurement systems. |
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