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Session: E8:10 AM Friday, December 12, 2008 Room: Red Lion |
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Session: E | Spectrum and Noise Measurement |
Chair: | Tom Ruttan, Intel Corporation |
Abstract: | This session deals with two very difficult topics in microwave measurement: spectrum analysis techniques and methods for characterizating network noise performance. |
| | E-1 | Real-Time Spectrum Analysis reveals Time Domain Characteristics of Frequency Domain Signals | 8:10 AM-8:40 AM | T. C. Hill, Tektronix. Inc., Beaverton, United States |
(34) | Many modern RF signals exhibit rapid time-variations, or transient interference. The Real-Time Spectrum Analyzer was developed to discover, trigger on, capture, and analyze such signals. This paper will discuss the differences between traditional and real-time spectrum analysis. The theory behind analysis without gaps will be presented and the types of signals revealed by an RTSA will be shown. | | |
E-2 | Using Spectrum Analyzer to Determine Frequency Modulation Accuracy of a Synthesizer and Its measurement Uncertainty | 8:40 AM-9:00 AM | Y. B. Lee, Anritsu Company, Morgan Hill, United States |
(41) | Frequency modulation is a method to embed information over a carrier by modulating its frequency. Through modulation and demodulation of signals, any information can then be transmitted and received with a great fidelity. In today's world of communication, it is rather important to send digital data over media. FM is a very popular specification for all the signal sources and synthesizers. Modulation analyzer such as 8902 is often used as a tool to determine the FM accuracy. However, such a receiver is quite limted with frequency coverage. To extend the frequency range, a mixer has to be added. Larger uncertainty can be expected. Due to improved accuracy of the modern spectrum analyzer, which usually employs a digital IF scheme, a more cost-effective and accurate measurement of FM is not possible. We will discuss the testing process and uncertainty components for this direct measurement. | | |
E-3 | In-Situ Silicon integrated tuner for automated On-wafer MMW noise parameters extraction of Si HBT and MOSFET in the range 60-110GHz. | 9:00 AM-9:20 AM | Y. Tagro1, D. Gloria1, S. Boret1, Y. Morandini1, G. Dambrine2, 1STMicroelectronics, Crolles, France, 2IEMN, Villeneuve d'ascq, France |
(27) | In this paper, for the first time, Silicon integrated tuner is presented aiming silicon transistor (HBT, MOSFET) MilliMeter Wave (MMW) noise parameters (NFmin, Rn, Gamma_opt) extraction through multi-impedance method. The tuner design is based on variable R, C elements fulfilled with Cold-Fet and varactors controlled through biasing and associated to transmission lines (TL) for phase shifting. Design, electrical simulation and MMW measurement of the Tuner are described showing capability from 60GHz up to 110GHz for CMOS and BiCMOS sub65nm technologies characterization. |Gamma_opt| of 0.88 have been achieved at the DUT input in the considered frequency range and Tuner losses are less than 20 dB. | | |
E-4 | A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy | 9:20 AM-9:40 AM | G. Simpson1, D. Ballo2, J. Dunsmore2, A. Ganwani1, 1Maury Microwave Corporation, Ontario, United States, 2Agilent Technologies, Santa Rosa, United States |
(43) | A new method for noise parameter measurements is introduced, with better than 100x speed improvement over traditional methods. The setup is simple and easy to configure, and the entire calibration and measurement process is very fast, making dense frequency spacing practical. The new method produces smoother data with lower scatter, and the dense frequency spacing eliminates shifts due to aliasing and makes it easier to identify the scatter and outliers. | | |
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