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Session: D4:00 PM Thursday, December 11, 2008 Room: Red Lion |
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Session: D | Non-Linear Network Test Equipment |
Chair: | John Wood, Freescale Semiconductor |
Abstract: | This session covers test equipment enhancements for measuring non-linear networks: combining load-pull and an NVNA for x-parameters of power amplifiers, efficient methods for characterizing passive load-pull tuners, and a method to stretch the bandwidth of a vector signal generator. |
| | D-1 | Load-Pull + NVNA = Enhanced X-Parameters for PA Designs with High Mismatch and Technology-Independent Large-Signal Device Models | 4:00 PM-4:20 PM | G. Simpson1, J. Horn2, D. Gunyan2, D. E. Root2, 1Maury Microwave Corporation, Ontario, United States, 2Agilent Technologies, Santa Rosa, United States |
(45) | The extraction of X-parameters – the superset of S-parameters for nonlinear components - has been extended to cover the entire Smith Chart by an automated application combining a Nonlinear Vector Network Analyzer (NVNA) instrument with automated load-pull measurements. The augmented X-parameter data can be immediately used in a nonlinear simulator for complex microwave circuit analysis and design. This capability extends the applicability of measurement-based X-parameters to highly mismatched environments, such as high-power and multi-stage amplifiers, and power transistors designed to work far from 50 ohms. It provides a powerful and general technology-independent alternative, with improved accuracy and speed, to traditional large-signal device models which are typically slow to develop and essentially extrapolate large-signal operation from small-signal and DC measurements. | | |
D-2 | A New Technique for Decreasing the Characterization Time of Passive Load-Pull Tuners to Maximize Measurement Throughput | 4:20 PM-4:40 PM | C. Roff2, J. Graham1, J. Sirois1, B. Noori1, 1Freescale Semiconductor, Inc., Tempe, United States, 2Cardiff University, Cardiff, United Kingdom |
(42) | This paper presents a technique for increasing the flexibility and the point density of passive load-pull tuner characterization coverage from a reduced measurement collection cycle. Interpolation methods are used to enhance the resolution of available tuner positions whilst drastically reducing the time required for data collection prior to useful load-pull measurement. Results are presented to demonstrate validation of the method, showing that the mathematical accuracy in the predicted tuner S-parameters is greater than the reported physical reproducibility of the tuners. The impact of the new technique on characterization time is demonstrated to yield a time saving of 80% – drastically increasing potential measurement throughput. | | |
D-3 | Inexpensive Solution to Double RF Bandwidth of Vector Signal Generator | 4:40 PM-5:00 PM | D. Schreurs, J. Alonso Romero, J. Martinez San Roman, M. Homayouni, G. Avolio, B. Nauwelaers, K.U.Leuven, Leuven, Belgium |
(15) | There is a clear tendency to develop upcoming telecommunication applications at increasing RF carrier frequencies. To enable realistic characterizations of RF building blocks, the use of a vector signal generator, enabling modulated excitations, is indispensable. This paper presents an inexpensive way to extend the RF bandwidth of a commercial vector signal generator. The developed set-up consists of a frequency doubler, one or more amplifiers, and the necessary filters. As it is important to control the excitation applied to the circuit-under-test, a predistortion algorithm has been developed. It is shown that the main difficulty is the suppression of unwanted intermodulation products generated by the frequency doubler. The successful implementation is illustrated by the amplitude and phase controllable generation of two-tone signals. | | |
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