Session: C

1:20 PM Thursday, December 11, 2008

Room: Red Lion
     
Session: C
Non-Linear Network Analysis Applications
Chair:
Jean-Pierre Teyssier, University of Limoges XLIM
Abstract:
The topic of this session is the measurement of non-linear networks: LSNA based measurement of optically modulated switches, multi-tone stimulus/response measurement of active components for communications, and an RF waveform metrology approach to amplifier characterization.
 
 
C-1
Microwave characterization of optically modulated photo-induced switches with a passivation layer using an LSNA
1:20 PM-1:40 PM
C. Roda Neve1, G. Poesen2, D. Schreurs3, J. Raskin1, J. Stiens2, R. Vounckx2, 1UCL, Louvain-la-neuve, Belgium, 2VUB, Brussels, Belgium, 3K.U.Leuven, Leuven, Belgium
(31)
A measurement set-up has been developed to characterize the electrical response to a pulsed optical excitation on photo-induced switches. The hardware configuration is a combination of a 50 GHz LSNA and a laser modulated by a pulse generator. By making use of vector large-signal measurements, the pulse envelope response is measured which allows the study of transient effects as well as the determination of performance parameters such as excess carrier lifetime. It is demonstrated that depositing a passivation layer beneath the CWP transmission line switch reduces the carrier life time considerably.
 
 
C-2
Nonlinear Network Analysis for Modern Communication Devices and Systems
1:40 PM-2:00 PM
E. Zenteno1, O. Andersen3, M. Isaksson1, N. Keskitalo3, D. Wisell2, 1University of Gävle, Gävle, Sweden, 2Ericsson AB, Stockholm, Sweden, 3Ericsson AB, Gävle, Sweden
(36)
This paper presents a novel test setup, based on a vector signal generator (VSG) and a vector signal analyzer (VSA), capable of nonlinear characterization of communications devices such as RF power amplifiers. Envelope time-domain waveform extraction and correction is applied to the DUT reference plane, preserving vector correction even in modulated environments where ingoing and outgoing signals from the ports of the DUT can be distinguished. This tool is valuable in the analysis of nonlinear devices, the generation of behavioral models and the study of memory effects..
 
 
C-3
RF Waveform metrology for characterization of non-linear amplifiers
2:00 PM-2:20 PM
D. A. Humphreys1, G. Watkins2, K. Morris2, J. Miall1, 1National Physical Laboratory, Teddington, United Kingdom, 2Bristol University, Bristol , United Kingdom
(28)
Radio Frequency Waveform metrology (RFWM), based on real-time digital oscilloscopes, has been used to evaluate the performance of a non-linear E-class amplifier developed for WCDMA at 840 MHz. A timing error in the modulation signal gave abnormally high EVM values when measured using commercial equipment. The EVM of the source and amplifier are estimated as 0.4% and 2% respectively using RFWM. Results for simple WM based evaluation tools show amplifier distortion and may offer insights over optimization using simple parameters such as Adjacent Channel Leakage Ratio.
 
 
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