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Session: B10:40 AM Thursday, December 11, 2008 Room: Red Lion |
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Session: B | Linear Network Measurement |
Chair: | Ken Wong, Agilent Technologies, Inc. |
Abstract: | This session studies aspects of measurement of linear networks: extreme impedances, statistical enhancement methods, and an envelope domain approach. |
| | B-1 | Wideband measurement of extreme impedances with a multistate reflectometer | 10:40 AM-11:10 AM | A. Lewandowski2, D. LeGolvan1, R. A. Ginley1, T. M. Wallis1, A. Imtiaz1, P. Kabos1, 1National Institue of Standards and Technology, Boulder, United States, 2Warsaw University of Technology, Warsaw, Poland |
(44) | Abstract--- We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We process these measurements using statistical techniques that allow us to exploit the redundancy in order to increase the measurement bandwidth and reduce the measurement uncertainty. We demonstrate our technique for a simple setup containing a power splitter and an unknown variable reference impedance connected to one of its arms and an unknown extreme-impedance device connected to its other arm. The variable reference impedance is realized as either a set of mechanical standards or an electronically tunable impedance. Measurement results show that the repeatability of the reference impedance values is essential for achieving increased accuracy. | | |
B-2 | Statistical Measurement Techniques for Equivalent Source Mismatch of 1.85 mm Power Splitter | 11:10 AM-11:30 AM | T. M. Wallis1, A. Lewandowski2, 1NIST, Boulder, United States, 2Warsaw University of Technology, Warsaw, Poland |
(40) | The equivalent source mismatch (gamma G) of a 1.85 mm coaxial power splitter was characterized using two statistical measurement techniques. The first technique, originally described in reference [1], uses a modified one-port calibration method to determine gamma G. The second method uses two-port measurements of the splitter with one of the ports loaded with a series of calibration standards. In addition to gamma G, the second method provides measurements of S parameters for the three-port device. The measurements of gamma G are in good agreement for both techniques. This demonstrates that equivalent source mismatch gamma G of a splitter can be determined using statistical measurement techniques, which provides the possibility of exploiting redundant measurements to reduce uncertainty in determination of gamma G. | | |
B-3 | An Envelope Domain Measurement Test Setup to Acquire Linear Scattering Parameters | 11:30 AM-11:50 AM | E. Zenteno1, M. Isaksson1, N. Keskitalo1, D. Wisell2, O. Andersen3, 1University of Gävle, Gävle, Sweden, 2Ericsson AB, Stockholm, Sweden, 3Ericsson AB, Gävle, Sweden |
(30) | In this paper the functionality of a vector network analyzer VNA is implemented using the concept of software defined measurements (SDM) [1], called SDM-VNA. A general measurement set-up based on a vector signal generator (VSG) and a vector signal analyzer (VSA) is used. The setup allows complete linear characterization using only one receiver. A calibration procedure to get rid of the systematic errors is applied so the results have been compared against modern VNA showing good agreement. | | |
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